Semiconductor Detectors for X-ray Free Electrons Lasers: from fundamental concepts to open challanges

 

Chiara Guazzoni
Politecnico di Milano, Dipartimento di Elettronica, Informazione e Bioingegneria and INFN, Sezione di Milano

    The lecture will be divided into two parts. The first one will review the basic concepts of semiconductor detectors operation and will illustrate the main detector technologies, architectures and performance for X-ray imaging and spectroscopy, so that even non specialists can follow the second more advanced part.
The high instantaneous intensity sometimes coupled with high repetition rate – as in the case of the 4.5 MHz of the European X-Ray Free-Electron Laser (XFEL)  – poses new challenges for imaging detectors. The second part will discuss such challenges, as for example plasma effects and radiation damage and will illustrate some of the state-of-the-art area detectors presently used at Linear Coherent Light Source (LCLS, Stanford, California, USA) or under development for the European XFEL.